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Low and cryogenic temperature mechanical performance and fracture behavior of micro-scale Cu/Sn–3.0Ag–0.5Cu/Cu joints with the decreasing dimension

机译:尺寸减小的微型Cu / Sn-3.0Ag-0.5Cu / Cu接头的低温和低温力学性能及断裂行为

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Tensile deformation and fracture behavior of micro-scale Cu/Sn–3.0Ag–0.5Cu/Cu joints with a constant diameter of 400 µm and the decreasing thickness (from 400 to 200 and then to 100 μm) were characterized at low and cryogenic temperatures in this study. Results show that with decreasing temperature and joint thickness the joint tensile strength increases. Fracture behavior of solder joints also exhibits a temperature-dependency. As the temperature decreases, there is a shift in the fracture position from the solder matrix to the interface between solder matrix and interfacial Cu6Sn5 layer, the fracture mode changes from ductile to brittle. Moreover, the temperature corresponding to fracture position transition increases with decreasing joint thickness.
机译:在低温和低温下表征了直径为400 µm且厚度不断减小(从400减小到200,然后减小到100μm)的微型Cu / Sn-3.0Ag-0.5Cu / Cu接头的拉伸变形和断裂行为。在这个研究中。结果表明,随着温度和接头厚度的降低,接头的抗拉强度增加。焊点的断裂行为也表现出温度依赖性。随着温度降低,断裂位置从焊料基体到焊料基体与界面Cu6Sn5层之间的界面发生位移,断裂模式从韧性转变为脆性。而且,对应于断裂位置转变的温度随着接头厚度的减小而增加。

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