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Novel photodetector based on FD-SOI substrate with interface coupling effect

机译:具有界面耦合效应的基于FD-SOI衬底的新型光电探测器

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We have proposed and demonstrated experimentally a novel semiconductor photodetector based on fully depleted silicon-on-insulator (FD-SOI) substrate. The device utilizes the interface coupling effect uniquely found in FD-SOI MOSFET, in which the photo-generated electrons accumulate at the top interface modulate the hole current at the bottom interface. The responsivity of this device reaches more than 1×104A/W and, unlike other photodetectors based on SOI substrate, increases as the top silicon layer thickness reduces.
机译:我们已经提出并实验证明了一种基于完全耗尽绝缘体上硅(FD-SOI)衬底的新型半导体光电探测器。该器件利用了FD-SOI MOSFET中独特的界面耦合效应,其中在顶部界面处积累的光生电子会在底部界面处调制空穴电流。该设备的响应度达到1×10以上 4 与其他基于SOI衬底的光电检测器不同,A / W随着顶部硅层厚度的减小而增加。

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