首页> 外文会议>IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems >Investigation of Microstructural Evolution in SAC Solders Exposed to Short-Term and Long-Term Aging
【24h】

Investigation of Microstructural Evolution in SAC Solders Exposed to Short-Term and Long-Term Aging

机译:短期和长期老化的SAC焊料的微观结构演变研究

获取原文

摘要

The microstructure and mechanical properties of Sn-Ag-Cu (SAC) solder joints in electronic assemblies are constantly evolving when exposed to isothermal aging. In particular, both the stress-strain behavior and creep behavior of SAC solders degrade significantly with aging exposures. These changes in solder mechanical behavior are a result of the evolution of the solder microstructure that occurs during aging. The most well-known and widely observed changes are coarsening of the Ag3Sn and Cu6Sn5intermetallic compounds (IMCs) present in the eutectic regions between beta-Sn dendrites. In our prior investigation, we have developed new procedures to study the coarsening of IMC Particles that occur in a small fixed region of a SAC305 solder joint sample after several durations of aging. Scanning Electron Microscopy (SEM) has been utilized to examine aging induced coarsening of IMCs occurring within lead free solders. To identify the fixed region of interest for subsequent SEM imaging, a nanoindentation system was used to make small markers at the corners of the studied region in the solder joint sample. The markers were used to position the sample and locate the same region of the microstructure precisely. In the current work, we have extended our prior study to examine microstructural evolution in SAC305 lead free alloys for both short and long term aging experiments. Samples were formed with reflowed cooling profiles and resulting initial microstructures, and then polished microscopy cross-sections were prepared. For short term aging experiments, the microstructures were observed and recorded in the selected regions after every one hour of aging exposures using Scanning Electron Microscopy (SEM). For long term aging experiments, the microstructures of the several fixed regions of interest were recorded every 250 hours. After each aging time, we were able to quantitatively analyze the evolution of Ag3Sn and other IMCs with aging. Specifically, the aging induced changes in number of IMCs, total area of all IMCs, average area of a particle, average diameter of a particle and the normalized diameter were quantified in the fixed regions. Quantitative analysis results show that the number of IMC particles decreases while the average diameter of the particles increases significantly (more than 300%) with increasing aging time. With that being said, the most of the changes in the microstructure were found to occur within first 250 hours of aging. Finally, empirical models describing the growth of IMC particles with aging were examined and applied to our experimental data.
机译:电子组件中的Sn-Ag-Cu(SAC)焊点暴露于等温老化后,其微观结构和力学性能会不断发展。尤其是,SAC焊料的应力应变行为和蠕变行为都随着老化暴露而显着降低。焊料机械行为的这些变化是老化过程中发生的焊料微结构演变的结果。最广为人知和广泛观察到的变化是银的粗化 3 锡和铜 6 5 金属间化合物(IMC)存在于β-Sn树突之间的共晶区域中。在我们先前的研究中,我们开发了新的程序来研究在若干次老化后在SAC305焊点样品的固定小区域中发生的IMC颗粒的变粗。扫描电子显微镜(SEM)已用于检查无铅焊料中IMC的老化引起的粗化。为了识别感兴趣的固定区域以进行后续的SEM成像,使用了纳米压痕系统在焊点样品中研究区域的角落制作了小的标记。标记用于定位样品并精确定位微结构的相同区域。在当前的工作中,我们扩展了先前的研究,以检查SAC305无铅合金的微观结构演变,以进行短期和长期时效试验。形成具有回流冷却曲线的样品并产生初始的微观结构,然后制备抛光的显微镜横截面。对于短期老化实验,使用扫描电子显微镜(SEM)在老化的每一小时后观察并记录所选区域中的微观结构。对于长期老化实验,每250小时记录几个感兴趣的固定区域的微观结构。在每个老化时间之后,我们能够定量分析Ag的演变 3 锡和其他IMC会老化。具体地,在固定区域中定量老化引起的IMC的数量,所有IMC的总面积,颗粒的平均面积,颗粒的平均直径和归一化直径的变化。定量分析结果表明,随着时效时间的增加,IMC颗粒数量减少,而平均直径显着增加(大于300%)。话虽如此,发现显微组织的大部分变化都发生在老化的前250小时内。最后,检验了描述IMC颗粒随时间增长的经验模型,并将其应用于我们的实验数据。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号