首页> 外文会议>ASME annual dynamic systems and control conference >MODELING AND VALIDATION OF CAPACITIVE TYPE RF MEMS SWITCHES FOR LOW ACTUATION VOLTAGE AND HIGH ISOLATION
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MODELING AND VALIDATION OF CAPACITIVE TYPE RF MEMS SWITCHES FOR LOW ACTUATION VOLTAGE AND HIGH ISOLATION

机译:低致动电压和高隔离度的电容型RF MEMS开关的建模和验证

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Design objectives in capacitive type radio frequency micro electro mechanical switches (RF-MEMS) are to reduce actuation voltages and to obtain low insertion losses with high isolation. In this study, we report design, modeling and simulation of three new structural configurations using ANSYS to obtain the optimum geometry; further high frequency simulations are performed using HFSS to obtain low insertion losses and high isolation. The designed switches require only 3.9 to 5 V as pull-in voltage for actuation. The mechanical resonant frequency and quality factor are in the range of 6.5 to 8.7 kHz and 1.1 to 1.2, respectively. Switching times for all the designs are 32 to 38 μs at their respective pull-in voltages. Two of the switch designs have insertion loss of less than 0.25 to 0.8 dB at 60 and 50 GHz, and isolation greater than 58 dB for all three designs.
机译:电容式射频微机电开关(RF-MEMS)的设计目标是降低驱动电压并以高隔离度获得低插入损耗。在这项研究中,我们报告了使用ANSYS以获得最佳几何形状的三种新结构配置的设计,建模和仿真。使用HFSS进行进一步的高频仿真以获得低插入损耗和高隔离度。设计的开关仅需要3.9至5 V的拉动电压即可启动。机械共振频率和品质因数分别在6.5至8.7 kHz和1.1至1.2的范围内。所有设计在其各自的吸合电压下的开关时间均为32至38μs。其中两种开关设计在60和50 GHz时的插入损耗小于0.25至0.8 dB,而对于所有三种设计,隔离度均大于58 dB。

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