Microwave imaging of subsurface defects in dielectric structures using complementary split ring resonator

摘要

A novel microwave subsurface diagnostic procedure for detection of defects inside coated dielectric structures using complementary split ring resonator (CSRR) based planar microwave sensor is presented. The sensor is made to scan the test structure and the shift in resonant frequency at the loaded and unloaded conditions are recorded at each scan point. Quantitative as well as qualitative microwave images of the test region are formed based on these variations. Mathematical model based on the shift in resonant frequency is also developed to retrieve the permittivity distribution of the dielectric test structure. Simulation and experimental results validate the usability of the designed sensor for practical imaging purposes.