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Integration of InGaAs/InP structure above ROIC-CMOS for SWIR imaging

机译:在ROIC-CMOS上方集成InGaAs / InP结构用于SWIR成像

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Nowadays short wavelength infrared (SWIR) imaging based on InP/InGaAs photo-diodes is quite popular for uncooled camera. The state of the art technology is a double layer planar heterointerface focal plane array [1]. But, it remains expensive and only used for defense and scientific applications. Its cost comes essentially from the individually hybridization of photo-diodes array with read-out circuit, by the mean of an indium-bumps flip-chip process. We suggest an alternative method for hybridization, in order to lowering the cost and providing a sustainable process to decrease the pixel pitch, and also increase the possible format. It consists in a direct integration of InP/InGaAs/InP structure above a finished read-out circuit (with CMOS technology) and circular diode architecture.
机译:如今,基于InP / InGaAs光电二极管的短波长红外(SWIR)成像在非制冷相机中非常流行。最先进的技术是双层平面异质界面焦平面阵列[1]。但是,它仍然很昂贵,仅用于国防和科学应用。它的成本主要来自于通过铟凸块倒装芯片工艺将光电二极管阵列与读出电路的单独混合。我们建议使用另一种杂交方法,以降低成本并提供可持续的过程来降低像素间距,并增加可能的格式。它包括在完成的读出电路(采用CMOS技术)和圆形二极管架构之上的InP / InGaAs / InP结构直接集成。

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