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Single Event Effects And Total Dose Testing Of Digital To Analog Converters

机译:数模转换器的单事件效应和总剂量测试

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In the article we introduce histogram method for digital to analog converters' space radiation testing including both total dose and single event effects. We present new total dose and single event (SEL, SEU and SET) data of three DAC chips, as well as test setup and measurement system structure.
机译:在本文中,我们介绍了用于数模转换器空间辐射测试的直方图方法,包括总剂量和单事件效应。我们提供了三个DAC芯片的新总剂量和单事件(SEL,SEU和SET)数据,以及测试设置和测量系统结构。

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