首页> 外文会议>International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems >The intriguing electronic and optical properties modulation in blue phosphorene/g-III-nitrides heterostructures
【24h】

The intriguing electronic and optical properties modulation in blue phosphorene/g-III-nitrides heterostructures

机译:蓝色磷/ g-III-氮化物异质结构中有趣的电子和光学性质调制

获取原文

摘要

In this work, the structural, electronic and optical properties of blue phosphorene (BP) and graphene-like III-nitrides, denoted as g-XN (AlN and GaN) nanocomposites are investigated by the first-principles method. Our results unveil that the hybridized BP/g-XN bilayers exhibit a decreased band gap. We also find that the optically active states of the maximum valence and minimum conduction bands are localized on opposite monolayers, leading to electrons and holes spontaneously separated, which enhances the photocatalytic efficiency. More interestingly, despite of the indirect band gap nature of the BP and g-AlN monolayers, BP/g-AlN heterostructure in most energetic preferable pattern exhibits a moderate direct band gap. The BP/g-XN heterobilayers also exhibit a significant improved visible light and UV adsorption peak, comparable or even superior to pristine BP, and the superior optical properties is robust, independent of stacking pattern. Therefore, the g-XN layers can be an excellent solution to protect the BP layer from its degradation in ambient conditions. We predict that such effective electronic band gap engineering, together with intriguing optical properties, point toward the potential of BP/g-XN heterobialyers for applications in a variety of nanodevices.
机译:在这项工作中,通过第一原理方法研究了表示为g-XN(AlN和GaN)纳米复合材料的蓝色磷(BP)和类似于石墨烯的III型氮化物的结构,电子和光学性质。我们的结果表明,杂交的BP / g-XN双层膜的带隙减小。我们还发现,最大价态和最小导带的光学活性态位于相对的单分子层上,导致电子和空穴自发分离,从而提高了光催化效率。更有趣的是,尽管BP和g-AlN单层具有间接带隙性质,但在大多数高能优选模式中BP / g-AlN异质结构仍表现出中等的直接带隙。 BP / g-XN异质双分子层还显示出显着改善的可见光和UV吸收峰,与原始BP相当甚至更好,并且优异的光学性能很强健,与堆叠模式无关。因此,g-XN层可以是保护BP层免于在环境条件下降解的极佳解决方案。我们预测,这种有效的电子带隙工程技术以及引人入胜的光学性能,表明BP / g-XN异源分析仪在各种纳米器件中的应用潜力。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号