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A low-power on-chip calibration technique for pipelined ADCs

机译:用于流水线ADC的低功耗片上校准技术

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This paper proposes a new low-power on-chip calibration technique, called One-Time Calibration. Compare to the traditional calibration techniques our calibration circuit is realized fully on-chip which consumes very little power and small chip area; besides it needs no auxiliary circuits at all during the conversion. A 10-Bit 200MSps pipelined ADC using our new calibration technique is designed in a 55-nm CMOS technology. The on-chip calibration circuit only consumes a power of less than 5mW and increases the analog core chip area only by 10%. The post simulation results show that the ADC reaches an ENOB of 9.0-Bit after calibration for all conditions (-40-+85°C, ±10% VDD) at Nyquist rate.
机译:本文提出了一种新的低功耗片上校准技术,称为一次性校准。与传统的校准技术相比,我们的校准电路完全在芯片上实现,仅消耗很少的功率和较小的芯片面积。此外,转换期间完全不需要辅助电路。采用我们的新校准技术的10位200MSps流水线ADC是在55nm CMOS技术中设计的。片上校准电路仅消耗小于5mW的功率,并且仅将模拟核心芯片面积增加10%。仿真后的结果表明,在所有条件(-40- + 85°C,±10%VDD)下,以奈奎斯特速率校准后,ADC的ENOB均达到9.0位。

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