THz emission-based magnetic field distribution mapping using InSb as probe semiconductor

摘要

We present a feasibility study of THz surface emission from semiconductors as a mapping tool for magnetic field distribution. Using a standard THz time-domain spectroscopy setup, the THz emission of indium antimonide (InSb) was systematically measured at different points of an external magnetic field. The initial results suggest promising directions in developing a THz emission-based magnetic field mapping technique for non-destructive electromagnetic imaging applications.