Secondary reflection removal for extracting laser stripe center

摘要

For removing secondary reflection to extract laser stripe center in line structured light measurement, detection of primary reflection using multi-scale morphological gradient is presented. The proposed algorithm mainly consists of two stages: background subtraction and reflection detection. Firstly, background model is established using mixture of Gaussian, and foreground stripe is detected with reflection model. Secondly, reflection stripe is described using multi-scale morphological gradient, and secondary reflection stripe is removed with normalized cross correlation. Experimental results demonstrate that the proposed method is effective for secondary reflection removal and laser stripe center extraction.