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Implantation effects of ultra-thin Fe/Cr multilayers

机译:超薄Fe / Cr多层的植入效应

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The magnetic and structural properties of ultra-thin Fe/Cr multilayers (MLs) after ion implantation by 150 keV Cr and Fe ions have been investigated using a vibrating sample magnetometer (VSM) and a conversion electron Mossbauer spectroscopy (CEMS) to clarify a relation among the magnetization, giant magnetoresistance (GMR) properties and the interface structure. We have shown that the ion implantation induces the degradation of the interface structure resulting in a break of antiferromagnetic coupling and a decrease of magnetization, which correspond to the change of GMR properties.
机译:使用振动样品磁力计(VSM)和转化电子母动母动谱(CEM)研究了通过150keV Cr和Fe离子的离子注入后的超薄Fe / Cr多层(MLS)的磁性和结构性能。在磁化,巨磁阻(GMR)性能和界面结构中。我们已经表明,离子植入诱导界面结构的劣化导致反铁磁耦合的断裂和磁化的减小,这与GMR性能的变化相对应。

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