Estimation of oxide breakdown effects by fault injection

摘要

Aging of integrated circuits is recognized as a major reliability issue and the estimation of its effects is mandatory in the design of safety-critical systems. Fault injection is a valid method to evaluate the effects of faults on systems. This paper presents a fault injection framework to evaluate the effects of aging on the paths of circuits. Among the main aging mechanisms affecting circuits, the focus here is on oxide breakdown. The paper proposes a fault model that combines accuracy for the evaluation of the effects and rapidity for the execution of large fault injection campaigns. The proposed fault model and fault injection framework have been evaluated on two multi-core architectures implemented on two different technologies.