首页> 外文会议>European Conference on Radiation and Its Effects on Components and Systems >Analysis of SEL on commercial SRAM memories for latchup detection and protection in LEO space applications
【24h】

Analysis of SEL on commercial SRAM memories for latchup detection and protection in LEO space applications

机译:LEO空间应用中用于闩锁检测和保护的商用SRAM存储器上的SEL分析

获取原文

摘要

SEL characterization of commercial SRAM memories has been carried out to select the best candidate for a latchup experiment in LEO space environment. A circuit for SEL detection and protection has been proposed and tested at CERN in the CHARM mixed-field facility.
机译:已经对商用SRAM存储器进行SEL表征,以选择LEO空间环境中闩锁实验的最佳候选者。已经在CARM混合场设施的CERN提出并测试了用于SEL检测和保护的电路。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号