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Adhesion enhancement for electroless plating on mold compound for EMI shielding with industrial test compliance

机译:具有工业试验依从性的EMI屏蔽模具化合物对霉菌化合物的粘附增强

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In the manufacturing process, metal capping for EMI shielding is done during the integrated circuit (IC) assembly process, which hinders the attempt of reducing the size of electronic device and also incurs higher cost of assembly. Therefore direct deposition of metal on IC mold compound is desirable. Conventional metal plating techniques, however fail tape test. This paper studies the condition of plating metal directly onto surface of mold compound with the enhancement of novel non-etching adhesion promoter CovaBond MR. By plating direct onto mold compound, the shielding capping task can be done in array form before the die saw process in IC manufacturing (before IC assembly), which reduce the thickness and dimension of chip and improves design flexibility of circuit board as well as reduce the manufacturing cost. The industrial test results in this paper have proven the performance of the enhanced metal plating technique.
机译:在制造过程中,在集成电路(IC)组装过程中,在集成电路(IC)组装过程中进行EMI屏蔽的金属覆盖,其阻碍了减少电子设备尺寸的尝试,并且还引发更高的组装成本。因此,需要直接沉积金属对IC模塑化合物。常规金属电镀技术,但是失效胶带测试。本文用新型非蚀刻粘合促进剂Covabond Mr,研究了直接电镀金属的条件直接在模具化合物表面上。通过将直接电镀到模具化合物上,可以在IC制造(IC组件之前)中的模具锯工艺之前以阵列形式进行屏蔽封盖任务,这减少了芯片的厚度和尺寸并提高了电路板的设计灵活性以及减少制造成本。本文的工业测试结果已证明增强型金属电镀技术的性能。

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