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Adhesion enhancement for electroless plating on mold compound for EMI shielding with industrial test compliance

机译:符合工业测试标准,增强了用于电磁干扰屏蔽的模塑料上化学镀的附着力

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In the manufacturing process, metal capping for EMI shielding is done during the integrated circuit (IC) assembly process, which hinders the attempt of reducing the size of electronic device and also incurs higher cost of assembly. Therefore direct deposition of metal on IC mold compound is desirable. Conventional metal plating techniques, however fail tape test. This paper studies the condition of plating metal directly onto surface of mold compound with the enhancement of novel non-etching adhesion promoter CovaBond MR. By plating direct onto mold compound, the shielding capping task can be done in array form before the die saw process in IC manufacturing (before IC assembly), which reduce the thickness and dimension of chip and improves design flexibility of circuit board as well as reduce the manufacturing cost. The industrial test results in this paper have proven the performance of the enhanced metal plating technique.
机译:在制造过程中,用于EMI屏蔽的金属封盖是在集成电路(IC)组装过程中完成的,这阻碍了减小电子设备尺寸的尝试,并且也招致了更高的组装成本。因此,期望将金属直接沉积在IC模塑化合物上。但是,常规的金属电镀技术无法通过胶带测试。本文研究了在新型非蚀刻增粘剂CovaBond MR的增强作用下,将金属直接镀在模塑料表面上的条件。通过直接电镀到模塑料上,可以在IC制造中的模切工艺之前(在IC组装之前)以阵列形式完成屏蔽封盖任务,从而减小了芯片的厚度和尺寸,提高了电路板的设计灵活性,并减少了制造成本。本文的工业测试结果证明了增强金属电镀技术的性能。

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