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A novel insight into transient behaviors of diode-triggered SCRs under VF-TLP testing by 2D/3D simulations

机译:通过2D / 3D仿真,对VF-TLP测试下二极管触发的SCR的瞬态行为有了新的认识

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摘要

Transient behaviors of the diode-triggered silicon controlled rectifiers (DTSCRs) under very-fast transmission line pulse (VF-TLP) testing are investigated in this paper. The underlying physics needs to be comprehensively investigated and 2D/3D device simulations are well performed and compared. Analysis uncovers that the turn-on process of intrinsic SCR is ascribed to Darlington effect as well as junction breakdown.
机译:本文研究了二极管触发的可控硅整流器(DTSCR)在非常快的传输线脉冲(VF-TLP)测试下的瞬态行为。需要对底层物理进行全面研究,并且2D / 3D设备仿真必须得到很好的执行和比较。分析发现,本征SCR的导通过程归因于达林顿效应以及结击穿。

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