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Electrically-driven surface plasmon nanosources

机译:电驱动的表面等离激元纳米源

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Electrical nanosources of surface plasmons will be an integral part of any future plasmonic circuits. Three different types of such nanosources (based on inelastic electron tunneling, high energy electron bombardment, and the electrical injection of a semiconductor device) are briefly described here. An example of a fundamental experiment using an electrical nanosource consisting of the tunnel junction formed between a scanning tunneling microscope (STM) and a metallic sample is given. In this experiment, the temporal coherence of the broadband STM-plasmon source is probed using a variant of Young's double slit experiment, and the coherence time of the broadband source is estimated to be about 5-10 fs.
机译:表面等离子体激元的电纳米源将成为未来任何等离子体激元电路的组成部分。本文简要介绍了三种不同类型的纳米源(基于非弹性电子隧穿,高能电子轰击和半导体器件的电注入)。给出了使用由扫描隧道显微镜(STM)和金属样品之间形成的隧道结组成的电纳米源进行基础实验的示例。在该实验中,使用杨氏双缝实验的变体探测了宽带STM等离子体激元源的时间相干性,估计宽带源的相干时间约为5-10 fs。

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