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Electrically-driven surface plasmon nanosources

机译:电动表面等离子体纳米源

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Electrical nanosources of surface plasmons will be an integral part of any future plasmonic circuits. Three different types of such nanosources (based on inelastic electron tunneling, high energy electron bombardment, and the electrical injection of a semiconductor device) are briefly described here. An example of a fundamental experiment using an electrical nanosource consisting of the tunnel junction formed between a scanning tunneling microscope (STM) and a metallic sample is given. In this experiment, the temporal coherence of the broadband STM-plasmon source is probed using a variant of Young's double slit experiment, and the coherence time of the broadband source is estimated to be about 5-10 fs.
机译:表面等离子体的电纳米座位将是任何未来等离子体电路的组成部分。这里简要描述了三种不同类型的这种纳米源(基于非弹性电子隧道,高能量电子轰击和电气注入半导体器件)。给出了由在扫描隧道显微镜(STM)和金属样品之间形成的隧道结组成的电纳米源的基本实验的示例。在该实验中,使用杨氏双缝实验的变体探测宽带STM-等离子体源的时间相干性,据估计宽带源的相干时间为约5-10fs。

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