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Numerical simulation and thermal analysis of PoP packaging

机译:PoP包装的数值模拟和热分析

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In this paper, by establishing PoP (package-on-package) packaging model, numerical simulation method was used to conduct the steady-state thermal analysis under a given power condition and the influence of thermal conductivity of packaging materials, including PCB (Printed Circuit Board), the number of chips and power distribution on the temperature of PoP packaging were explored. Finally, the distribution of stress field of package was also investigated based on the results of temperature distribution. Simulation results show that the highest temperature occurs in the center of the chip and gradually decreases to the surrounding environment. The increase of thermal conductivity for packaging material can reduce the package temperature remarkably to an acceptable extent and the entire temperature of package rises with the increasing number of chips. The design of chip power has an effect on the package temperature and location of the maximum temperature. Large stress occurs due to the difference of thermal expansion coefficient between balls and substrates, which may result in the failure of PoP.
机译:本文通过建立PoP封装模型,使用数值模拟方法在给定功率条件下以及包括PCB(印刷电路板)在内的封装材料的导热系数的影响下进行稳态热分析。板),芯片数量和PoP封装温度下的功率分布进行了探讨。最后,根据温度分布的结果,研究了包装的应力场分布。仿真结果表明,最高温度出现在芯片的中心,并逐渐降低到周围的环境。包装材料的导热率的增加可以将包装温度显着降低到可接受的程度,并且包装的整个温度随着芯片数量的增加而升高。芯片电源的设计会影响封装温度和最高温度的位置。由于球和基板之间的热膨胀系数不同,因此会产生较大的应力,这可能会导致PoP失效。

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