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Electrochemical analysis of the effect of accelerator in methanesulfonic acid bath for copper electrodeposition

机译:甲烷磺酸浴中促进剂对铜电沉积效果的电化学分析

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In order to realize a void-free TSV fill for Cu electrodeposition in methanesulfonic acid plating bath with high efficiency, additives are required to convert the electroplating mode to “bottom-up filling”. In this paper, UPT3360A, whose main component was Bis-(3-sodiumsulfopropyl disulfide) (SPS), was used as accelerator in MSA plating bath, and the effect of the accelerator for via filling was investigated by various electrochemical techniques including electrochemical impedance spectroscopy and chronopotentiometry. The results indicated that the reduction of Cu to Cu was accelerated by accelerator. UPT3360A has strong acceleration effect when the concentration was around 0.5 mg/L, and the effect tended to be saturated as the concentration increased to above 1 mg/L. However, higher concentration of accelerator, up to 4 mg/L, led to an inhibiting effect rather than an accelerating one, which might probably attribute to the fixed concentration of Cl and the reduction degree of SPS. Furthermore, the coverage of accelerator on electrode was studied. According to the fitting data of Toth model, the standard Gibbs free energy was calculated to be -36.825 kJ mol, which is lower than that of inhibitor, suggesting that accelerator absorbed on electrode surface is more likely to be replaced by inhibitor during Cu electroplating.
机译:为了高效地实现在甲磺酸电镀液中进行铜电沉积的无空隙TSV填充,需要使用添加剂才能将电镀模式转换为“自下而上填充”。本文将主要成分为Bis-(3-硫酸钠基丙基二硫)(SPS)的UPT3360A用作MSA电镀液中的促进剂,并通过包括电化学阻抗谱在内的各种电化学技术研究了促进剂对通孔填充的作用和计时电位计。结果表明,促进剂促进了Cu向Cu的还原。 UPT3360A在浓度约为0.5 mg / L时具有很强的加速作用,并且当浓度增加到1 mg / L以上时,该作用趋于饱和。但是,较高浓度的促进剂(最高4 mg / L)会产生抑制作用,而不是促进作用,这可能归因于Cl的固定浓度和SPS的还原度。此外,研究了促进剂在电极上的覆盖率。根据Toth模型的拟合数据,计算得出的标准吉布斯自由能为-36.825 kJ mol,低于抑制剂的自由能,这表明在铜电镀过程中,吸附在电极表面的促进剂更有可能被抑制剂替代。

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