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Package embedded decoupling capacitor impact on core power delivery network for ARM SoC application

机译:封装嵌入式去耦电容器对ARM SoC应用的核心供电网络产生影响

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In this paper, a BGA package having a ARM SoC chip is introduced, which has component-type embedded decoupling capacitors (decaps) for good power integrity performance of core power. To evaluate and confirm the impact of embedded decap on core PDN (power distribution network), two different packages were manufactured with and without the embedded decaps. The self impedances of system-level core PDN were simulated in frequency-domain and On-chip DvD (Dynamic Voltage Drop) simulations were performed in timedomain in order to verify the system-level impact of package embedded decap. There was clear improvement of systemlevel core PDN performance in middle frequency range when package embedded decaps were employed. In conclusion, the overall system-level core PDN for ARM SoC could meet the target impedance in frequency-domain as well as the target On-chip DvD level by having package embedded decaps.
机译:本文介绍了一种具有ARM SoC芯片的BGA封装,该封装具有组件类型的嵌入式去耦电容器(decaps),以实现核心电源的良好电源完整性。为了评估和确认嵌入式decap对核心PDN(配电网络)的影响,制造了两种带有和不带有嵌入式decap的不同封装。在频域中对系统级核心PDN的自阻抗进行了仿真,并在时域中进行了片上DvD(动态电压降)仿真,以验证封装嵌入式decap对系统级的影响。当采用封装嵌入式decaps时,在中频范围内系统级核心PDN性能有了明显改善。综上所述,ARM SoC的整个系统级核心PDN可以通过封装嵌入式decaps满足频域中的目标阻抗以及目标片上DvD级别。

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