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Towards a quantitative mechanistic understanding of the thermal cycling of SnAgCu solder joints

机译:对SnAgCu焊点的热循环进行定量的机械理解

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Microelectronics manufacturers continue to subject a wide range of products or representative test vehicles to accelerated thermal cycling tests. Most such testing is focused on comparisons, whether among alternatives or to an established requirement. However, more often than commonly recognized such comparisons may not reflect the relative performances in service. In fact, most current models have been shown to fail to account for important systematic trends as well as being inconsistent with our current understanding of the failure rate controlling damage mechanism. An alternative mechanistically justified model for the thermal fatigue life of SnAgCu solder joints has been proposed. Damage and failure occurs by recrystallization of the large Sn grains across the high strain region of the joint, followed by crack growth along the resulting network of high angle grain boundaries. The recrystallization was shown to be the damage rate controlling mechanism, except for extremely high strain assemblies and/or harsh cycling conditions, i.e. if we can predict the recrystallization we can predict the number of cycles to failure. So far the model accounts for a variety of important trends and offers guidance as to the interpretation and generalization of accelerated test results. General extrapolations towards service conditions will, however, require the specific functional dependence of the rate of recrystallization on the stress and the precipitate distributions. Another potential difficulty is that constitutive relations are extracted from single sided creep experiments while the dislocation cell structures built up under cyclic loading are certain to be different. Furthermore, the repeated ‘annealing’ during the high temperature dwell affects the hardening. Even if these effects could be ignored the ongoing evolution of the constitutive relations would still effectively prevent the extraction of the above-mentioned functional dependence from comparison- between thermal cycling results and FEM. A special experiment is ongoing in which stresses and strains on the solder joints can be controlled and measured directly, allowing the testing of individual assumptions underlying the proposed model. Preliminary results are presented and compared to results of thermal cycling across different temperature ranges.
机译:微电子制造商继续对广泛的产品或具有代表性的测试工具进行加速热循环测试。大多数此类测试都侧重于比较,无论是在替代方案之间还是与既定要求之间。但是,这种比较通常不能反映出服务中的相对性能,这要比通常公认的更为普遍。实际上,大多数当前模型已被证明无法说明重要的系统趋势,并且与我们目前对控制损坏机制的失效率的理解不一致。提出了SnAgCu焊点热疲劳寿命的另一种机械合理模型。损坏和破坏是通过在接头的高应变区域内大锡晶粒的再结晶而发生的,然后沿着沿高角度晶界形成的网络裂纹扩展。除了极高的应变组件和/或苛刻的循环条件外,重结晶被证明是破坏速率的控制机制,即,如果我们可以预测重结晶,则可以预测失效循环的次数。到目前为止,该模型考虑了各种重要趋势,并为加速测试结果的解释和一般化提供了指导。然而,对使用条件的一般推断将需要重结晶速率对应力和沉淀物分布的特定功能依赖性。另一个潜在的困难是,本构关系是从单面蠕变实验中提取的,而在循环荷载下建立的位错单元结构肯定是不同的。此外,高温停留期间反复进行的“退火”会影响淬火。即使可以忽略这些影响,本构关系的不断发展仍将有效地阻止从热循环结果与FEM之间的比较中提取上述功能依赖性。正在进行一项特殊的实验,可以直接控制和测量焊点上的应力和应变,从而可以测试所提出模型的各个假设。给出了初步结果,并将其与不同温度范围内的热循环结果进行了比较。

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