II-VI semiconductors; X-ray diffraction; annealing; copper; crystal defects; electrical resistivity; internal stresses; lithium; photoluminescence; scanning electron microscopy; semiconductor doping; semiconductor thin films; sol-gel processing; wide band gap semiconductors; zinc compounds; X-ray diffraction; ZnO:Cu; ZnO:Li; annealing effect; crystallinity; doped thin films; electrical properties; lattice defects density; photoluminescence; residual stress; resistivity measurements; scanning electron microscopy; sol-gel method; structural properties; Annealing; Atmosphere; Films; Lattices; Nitrogen; Surface morphology; Zinc oxide; Cu doped ZnO; I-V characteristics; Li; photoluminescence; sol-gel; stress; structural parameters; thin films;
机译:快速热退火对掺铝ZnO溶胶凝胶沉积薄膜的微观结构,电学性质和光学性质的影响
机译:氧分压和退火气氛对掺CuZnO薄膜微结构和光学性能的影响
机译:退火气氛对固溶生长Al掺杂ZnO薄膜和ZnO纳米棒光学和电学性质的影响
机译:氮气氛中退火对Li和Cu掺杂溶胶 - 凝胶ZnO膜结构,光致发光和电性能的影响
机译:退火温度对Sol-Gel ZnO薄膜力学性能的影响。
机译:使用两个铜前体通过溶胶凝胶工艺沉积的掺杂铜的ZnO薄膜:丙烷气氛中的气体传感性能
机译:掺杂浓度和退火温度对溶胶 - 凝胶法对Ga掺杂ZnO薄膜电和光学性质的影响