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Analysis of long-term stability of capacitors embedded in printed circuit boards

机译:嵌入印刷电路板的电容器的长期稳定性分析

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This paper presents studies of long-term stability of capacitors embedded in printed circuit boards. Planar capacitors fabricated from FaradFlex dielectric foil with copper plates laminated to FR-4 substrate served as test structures. The dielectric was BaTiO3 ceramic/polymer composition with various fillers and consequently various dielectric constants. Moreover test samples differed in composition thickness and surface size. The investigated capacitors were covered with LDP 2×106 (Laser Drillable Prepreg) protective layers to achieve embedded structures. The behaviour of capacitance as well as dissipation factor was investigated for two values of frequency (1 and 10 kHz) in order to determine their long-term stability. The in-situ accelerated ageing process (capacitance and dissipation factor of test samples performed directly at the ageing conditions) was carried out to perform long-term behaviour analysis. Temperature characteristics both before and after aging process were performed for determination of influence of environmental exposure. Additionally insulation resistance under voltage and temperature stress was monitored and analyzed.
机译:本文介绍了对嵌入印刷电路板的电容器的长期稳定性的研究。由FaradFlex介电箔制成的平面电容器,其铜板层压到FR-4基板上,用作测试结构。电介质是BaTiO 3陶瓷/聚合物组合物,具有各种填料,因此具有各种介电常数。此外,测试样品的成分厚度和表面尺寸也不同。被研究的电容器覆盖有LDP 2×106(激光可钻预浸料)保护层,以实现嵌入式结构。针对两个频率值(1和10 kHz)研究了电容的行为以及耗散因数,以确定其长期稳定性。进行原位加速老化过程(在老化条件下直接执行的测试样品的电容和耗散因数)以进行长期行为分析。进行老化过程之前和之后的温度特性,以确定环境暴露的影响。另外,还对电压和温度应力下的绝缘电阻进行了监测和分析。

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