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An analytical method for the measurement of trace level acidic and basic AMC using liquid-free sample traps

机译:使用无液体样品阱的痕量酸性和碱性AMC测定方法

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The measurement of parts-per-trillion (ppt) level acidic and basic airborne molecular contamination (AMC) is essential for process protection and yield control in semiconductor photo-lithography and adjacent applications. Real-time monitoring solutions are highly desired, as they provide instantaneous and continuous measurement. However, even the most advanced monitors cannot achieve detection limits in the low parts-per-trillion (ppt) range and many restrictions apply for the detection of acidic AMC. High cost of ownership is another disadvantage. Discontinuous sampling with sample traps is capable of achieving ppt-level measurement, but the currently accepted methods use sample traps filled with de-ionized water (impingers) to capture soluble acidic and basic AMC. Several inherent disadvantages of these methods result in inconsistent data and increased detection limits. Some proprietary solid state solutions have been reported, but involve complex preparation, have high background signals and require 24-72 hour sample duration, or they are protected trade secrets that are not available as an industry standard. To eliminate these disadvantages, we developed a liquid-free sample trap that allows parts-per-quadrillion level (ppq) measurement of acidic and basic AMC within one work shift, typically a 4-6 hour sample period. The traps can easily be manufactured and prepared in small lab operations, are sealed and protected from the outside and operator handling in the field, have months of shelf life and show high capture efficiencies while minimizing reactions and artifacts. Capacity results for the liquid-free base trap using ammonia (NH_3) as a test gas yielded more than 200 ppb-h at 100% capture efficiency without any moisture (simulating sampling of CDA or N_2) and 350 ppb-h at 40% RH. The capacity results for sulfur dioxide (SO_2) were highly dependent on moisture content of the sample gas and yielded 5 ppb-h at 90% capture efficiency and 0% RH, but increased exponentially to more than 1200 ppb-h at 40% RH. Performance testing indicates that the liquid-free trap provides both more precise and more accurate results for NH_3, SO_2 and HF in comparison to standard impinger in lab testing, with a relative standard deviation not exceeding 8% and capture efficiency greater than 95% for all three compounds. Acetic acid was the only compound that shows slightly decreased performance but still maintained a precision and accuracy comparable to the other compounds tested. In-field validation deployment to external and internal customers in parallel with standard wet impingers resulted in less than 10% difference between the traps, providing the necessary evidence that liquid-free traps are suitable for replacement of and better than wet impingers.
机译:兆亿分之一(ppt)级的酸性和碱性空气传播分子污染(AMC)的测量对于半导体光刻和邻近应用中的过程保护和成品率控制至关重要。实时监控解决方案非常需要,因为它们可以提供瞬时和连续的测量。但是,即使是最先进的监控器也无法达到低的万亿分之一(ppt)范围的检测极限,并且酸性AMC的检测也有许多限制。高昂的拥有成本是另一个缺点。使用样品阱的不连续采样能够实现ppt级的测量,但是当前公认的方法是使用充满去离子水(撞击器)的样品阱来捕获可溶性酸性和碱性AMC。这些方法的一些固有缺点导致数据不一致并增加了检测限。已经报道了一些专有的固态解决方案,但是涉及复杂的制备,具有高背景信号并且需要24-72小时的采样持续时间,或者它们是受保护的商业秘密,无法作为行业标准获得。为了消除这些缺点,我们开发了一种无液体的样品阱,可以在一个工作班次(通常为4-6小时的采样周期)内对酸性和碱性AMC进行百万分之几的水平(ppq)测量。捕集阱可在小型实验室操作中轻松制造和制备,密封并防止外部和现场操作人员操作,具有数月的保质期,并显示出高捕集效率,同时最大程度地减少了反应和假象。使用氨气(NH_3)作为测试气体的无液体碱阱的容量结果,在没有任何水分的情况下,在100%捕获效率下,产量超过200 ppb-h(模拟CDA或N_2的采样),在40%RH下,产率为350 ppb-h 。二氧化硫(SO_2)的容量结果高度依赖于样品气体的水分含量,在90%的捕集效率和0%的相对湿度下产生5 ppb-h,但在40%的相对湿度下呈指数增加,超过1200 ppb-h。性能测试表明,与实验室测试中的标准撞击器相比,无液阱可为NH_3,SO_2和HF提供更精确的结果,相对标准偏差不超过8%,捕获效率均高于95%三种化合物。乙酸是唯一一种性能略有下降但仍保持与其他测试化合物相当的精度的化合物。与标准湿式撞击器同时向外部和内部客户进行现场验证部署后,阱之间的差异不到10%,这提供了必要的证据,证明无液阱适用于湿式撞击器,并且比湿式撞击器更好。

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