Validity Evaluation of Application of TRL Calibration Method to Dielectric Waveguide Measurement by Electromagnetic Simulation

摘要

We have proposed to apply the Thru-Reflect-Line (TRL) calibration to the evaluation of dielectric waveguides to improve the measurement accuracy. When evaluating a dielectric waveguide, it is necessary to convert it into metallic transmission lines to connect to measurement ports of a vector network analyzer. Mismatches in connections of different types of cables lead to errors in measurements. We solved this problem by using the TRL calibration kits made of the same low-loss dielectric material as the dielectric waveguide under test. By electromagnetic simulations, we demonstrated the usefulness of the proposed technique at 28 GHz band.