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A test structure for analysis of temperature distribution in stacked IC with sensing device array

机译:具有感测装置阵列的堆叠式集成电路温度分布分析的测试结构

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A test structure for analysis of temperature distribution in stacked IC, which has a top tier chip attached on a bottom dummy chip with adhesive layer, is presented. The devices with four kinds of thickness of 50–410 um were fabricated. Dependences of the temperature on distance from the heater resistor were analyzed with on-chip sensor arrays, as well as fast transient phenomena. The thinner top tier structures showed the higher temperature and affected the temperature distributions. The test structure can provide an effective way for analysis of thermal properties in various LSIs.
机译:提出了一种用于分析堆叠式IC中温度分布的测试结构,该结构的顶层芯片连接在带有粘合剂层的底部虚拟芯片上。制作了四种厚度为50-410 um的器件。利用片上传感器阵列分析了温度对与加热电阻器的距离的依赖性以及快速瞬态现象。较薄的顶层结构显示较高的温度并影响温度分布。该测试结构可以为分析各种LSI中的热性能提供有效的方法。

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