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Investigation and Evaluation of High Power SiC MOSFETs Switching Performance and Overshoot Voltage

机译:高功率SiC MOSFET开关性能和过冲电压的调查与评价

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Silicon Carbide (SiC) MOSFETs, which are wide-bandgap semiconductor devices, have the capability to switch at much higher frequency in comparison with their silicon (Si) counterparts. High di/dt during fast switching transients will lead to semiconductor device failure due to overshoot voltage. It is a common belief that a snubber circuit is necessary for implementing the SiC MOSFETs into designs. However, this study shows that if stray inductance in the current commutation loop (CCL) is minimized with the combination of DC film capacitors and a two-layer laminated bus bar, there is not a need for snubber capacitors to suppress voltage overshoots. A 1200V 800A complete SiC MOSFETs based power structure is built for study. Theoretical model and SPICE model are built. The switching performances with DC electrolytic capacitors, film capacitors and snubber capacitors are evaluated with both SPICE based simulation and experiments, which proves that the snubber circuit can be removed.
机译:宽带隙半导体器件的碳化硅(SiC)MOSFET具有与其硅(SI)对应的相比,能够以更高的频率切换更高的频率。在快速开关瞬变期间的高DI / DT将导致由于过冲电压引起的半导体器件发生故障。这是一种常见的信念,即防滑电路对于将SiC MOSFET实现成设计。然而,该研究表明,如果当前换向环路(CCL)中的杂散电感通过DC膜电容器的组合和双层叠片汇流条最小化,则不需要缓冲电容器来抑制电压过冲。建立了基于1200V 800A完整的SiC MOSFET,用于研究。建立了理论模型和香料模型。使用基于Spice的模拟和实验评估了具有直流电电容器,薄膜电容和缓冲电容器的切换性能,这证明了可以去除缓冲电路。

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