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Novel in-plane gap closing CMOS-MEMS microphone with no back-plate

机译:无背板的新型面内间隙闭合CMOS-MEMS麦克风

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The stacking of metal/tungsten layers as the sensing electrodes for CMOS-MEMS microphone without the back-plate has been proposed and demonstrated for the first time. The acoustic pressure will deform the spring-diaphragm structure and further cause the in-plane gap-closing between sensing electrodes. Thus, acoustic pressure and dynamic response of spring-suspension can be determined by the sensing capacitance changes. Such design has the following merits: (1) no back-plate is required, (2) bias voltage to pull diaphragm close to back-plate is not required, (3) in-use pull-in and process stiction between diaphragm and back-plate is also prevented, (4) easy integration with sensing circuits. The design was implemented using the standard TSMC CMOS process. Typical microphone with 200μm-diameter diaphragm and 48-pairs sensing electrodes has been realized. Measurements show the sensitivity of microphone is −64.78dBV/Pa at 1kHz.
机译:首次提出并证明了金属/钨层的堆叠作为不带背板的CMOS-MEMS麦克风的传感电极。声压将使弹簧膜片结构变形,并进一步导致感测电极之间的面内间隙闭合。因此,可以通过感测电容的变化来确定弹簧悬架的声压和动态响应。这种设计具有以下优点:(1)不需要背板;(2)不需要偏置电压将隔膜拉到靠近背板;(3)使用中的吸合和隔膜与背板之间的过程粘滞还防止了极板的形成;(4)易于与传感电路集成。该设计是使用标准的TSMC CMOS工艺实现的。已经实现了具有200μm直径膜片和48对感应电极的典型麦克风。测量表明,麦克风的灵敏度在1kHz时为−64.78dBV / Pa。

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