Test of low power circuits: Issues and industrial practices

摘要

Managing the power consumption of circuits and systems is challenging not only during functional operations but also during manufacturing test. This paper discusses industrial practices in this area. It is organized into three main parts. First, we give necessary background and discuss issues arising from excessive power dissipation during test application. Then, we provide an overview of industrial practices for reducing test power. The last part surveys low power design techniques used in industry and shows how these low power devices can be tested safely without affecting yield and reliability.