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Test-mode-only scan attack using the boundary scan chain

机译:使用边界扫描链的仅测试模式扫描攻击

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Boundary-scan is a very popular technology with wide applications in product life cycle that ranges from product design, prototype debugging, production to field service. However, when it comes to securing a product such as smart card, RFID tag, set-top-box, etc., the technology can be targeted by an attacker to reveal the secret information of the chip. In this paper, for the first time, we will show that the boundary scan chain can be used to bypass the mode-reset countermeasure, which is used to thwart all the scan attacks that rely on switching between the normal mode and the test mode of the chip. We propose two attacks on the AES core. The first attack uses the boundary scan chain to apply input plaintexts to the first round of AES, whereas the second attack targets the final round by applying the inputs through the internal scan chain(s) and the round output is captured in the boundary scan chain. The attacks not only bypass the mode-reset countermeasure but also circumvent the affect of stimulus decompressor (first attack) or the response compactor (second attack). Both attacks retrieve the 128-bit secret key within one minute of execution.
机译:边界扫描是一项非常流行的技术,在产品生命周期中具有广泛的应用,从产品设计,原型调试,生产到现场服务,应有尽有。但是,当涉及保护诸如智能卡,RFID标签,机顶盒等产品时,攻击者可以利用该技术来揭示该芯片的机密信息。在本文中,我们将首次展示边界扫描链可用于绕过模式重置对策,该对策用于阻止所有依赖于在正常模式和测试模式之间切换的扫描攻击。芯片。我们建议对AES内核进行两次攻击。第一次攻击使用边界扫描链将输入纯文本应用于第一轮AES,而第二次攻击通过通过内部扫描链应用输入来针对最后一轮,并将该轮输出捕获在边界扫描链中。这些攻击不仅绕过了模式重置对策,而且还避免了刺激解压缩器(第一次攻击)或响应压缩器(第二次攻击)的影响。两种攻击都在执行的一分钟内检索到128位密钥。

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