An off-line MDSI interconnect BIST incorporated in BS 1149.1

摘要

This paper presents an off-line interconnect test methodology that implements the MDSI (Maximal Dominant Signal Integrity) crosstalk fault model. The test methodology consists of MDSI test pattern generators and response analyzers that are incorporated into the IEEE BS 1149.1 Standard on the two sides of an interconnect. This work is the first in implementing MDSI hardware structure. Our method is compared with hardware structures implementing MA interconnect tests.