首页> 外文会议>IEEE International Conference on Group IV Photonics >High Speed Selective-Area-Epitaxial Ge-on-SOI PIN Photo-detector Using Thin Low Temperature Si{sub}0.8Ge{sub}0.2 Buffer by Ultra-High-Vacuum Chemical Vapor Deposition
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High Speed Selective-Area-Epitaxial Ge-on-SOI PIN Photo-detector Using Thin Low Temperature Si{sub}0.8Ge{sub}0.2 Buffer by Ultra-High-Vacuum Chemical Vapor Deposition

机译:使用薄的低温Si {Sub}高速选择性区域外延Ge-On-SOI引脚光检测器0.8Ge {Sub} 0.2通过超高真空化学气相沉积进行缓冲

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摘要

Ge/SiGe/SOI PIN photodiodes with 15~17GHz bandwidth at 1550nm, external quantum efficiency of 20%~27% at 850nm, and bulk dark current density of 1.5~2mA/cm{sup}2, using low temperature Si{sub}0.8Ge{sub}0.2 buffer and without cyclic annealing were demonstrated.
机译:GE / SIGE / SOI引脚光电二极管,1550nm的带宽15〜17GHz带宽,外部量子效率为850nm的20%〜27%,散装暗电流密度为1.5〜2mA / cm {sup} 2,使用低温Si {sub} 0.8ge {sub} 0.2缓冲液,并且没有循环退火。

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