SYSTEM DESIGN AND EVALUATION OF ANTI-SEU METHODS

摘要

The in-obit "Single Event Upset(SEU)" effect of SRAM FPGA is unavoidable to happen. SEU effect is a great problem to the normal operation of spacecraft. Firstly, this paper evaluated system's anti-SEU methods based on simulation calculation of electronic elements. Secondly, evaluation algorithms of active and positive protection methods were presented. Finally, a TT&C system of spacecraft was taken as an example; the system's SEU probability and discontinuous working probability were calculated. The evaluation method can be used to calculate SEU probability of a whole spacecraft or constellation.