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Development of Liquid, Granule and Sheet Type Epoxy Molding Compounds for Fan Out Wafer Level Package

机译:用于粉丝外晶圆水平封装的液体,颗粒和片材型环氧模塑化合物的研制

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In worldwide semiconductor market has still inflated and required advanced, smaller, and lower cost package. From recently this situation, Fan-Out Wafer Level Package (FOWLP)/Panel Level Package has commercialized to fit for above demands. In this report, our three types of encapsulation materials, i.e., Liquid, Granule/Powder and Sheet encapsulation material, were expressed to apply for FOWLP/Panel Level Package. Those materials have each suitable manufacturing process. For example, one of them is Face up type Compression mold, other one is Face down type Compression mold and Vacuum lamination method and so on. We researched the best condition with each material and manufacturing process. In the future viewpoint, encapsulation for FOWLP/Panel Level Package, the warpage issue must be an especially key point for future application and more scale up process. The warpage issue for each encapsulation material and manufacturing process is discussed in here. We have experimented and verified the tendency of warpage with changing properties, constituent, and processes of each encapsulation. Firstly, in the Liquid area, we have checked as to how much influence different hardeners and encapsulation processes have on warpage. Secondly, in the Mold Sheet area, we verified the impact of process difference to warpage. Lastly, in the Granule/Powder area we verified the relation between several types of hardeners and curing degrees and warpage. In the experiment of influence of hardener on warpage, we have touched not only changing types of hardeners but also effect of catalyst. Also in the verification of curing degrees, we prepared some samples that had different curing degrees, for example, 50%, 70%, 90% before PMC (Post Mold Cure). And we checked the warpage of each sample after PMC. As for encapsulation processes, vacuum lamination and two types of compression mold equipment were used. As above, we tried to reduce the warpage with the combination of various conditions.
机译:在全球半导体市场仍然膨胀,需要先进,更小,更低的成本包。从最近这种情况,扇出晶圆级包装(Fowlp)/面板级封装已商业化以适合上述要求。在本报告中,表达了我们三种类型的封装材料,即液体,颗粒/粉末和薄片封装材料,适用于Fowlp /面板水平封装。这些材料具有每个合适的制造过程。例如,其中一个是面朝上型压缩模具,其它是面部朝下型压缩模具和真空层压方法等。我们研究了每种材料和制造过程的最佳状态。在未来的观点中,FOWLP /面板级别包的封装,翘曲问题必须是未来应用程序的尤其是关键点,并更加扩展过程。这里讨论了每个封装材料和制造过程的翘曲问题。我们已经尝试并验证了随着每个封装的变化,成分和过程的翘曲的趋势。首先,在液体区域中,我们已经检查了不同的硬化剂和封装过程对翘曲的影响程度。其次,在模具板面积中,我们验证了过程差与翘曲的影响。最后,在颗粒/粉末区域,我们验证了几种类型的硬化剂和固化度和翘曲之间的关系。在硬化剂对翘曲的影响的实验中,我们不仅触及了改变的硬化剂类型,而且感动了催化剂的影响。同样在固化度的验证中,我们制备了一些不同固化度的样品,例如PMC之前的50℃,70℃,90℃%(后模具固化)。我们在PMC后检查了每个样品的翘曲。对于封装过程,使用真空层压和两种类型的压缩模具设备。如上所述,我们试图通过各种条件的组合减少翘曲。

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