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Characterizations for 25G/100G High Speed Fiber Optical Communication Applications with Hermetic eWLB (Embedded Wafer Level Ball Grid Array) Technology

机译:具有密封EWLB(嵌入式晶圆级球网格阵列)技术的25G / 100G高速光纤光通信应用的特性

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As the fan-out wafer level package (FOWLP) technologies have become the popular solution for the next level of thin, high speed, high frequency and fine routing pitch packaging capability, the Embedded Wafer Level Ball Grid Array (eWLB) is designed to address the growing mismatch in interconnection gap, higher level of integration, improved electrical performance and shorter vertical interconnects. The eWLB technology is a versatile FOWLP platform providing a robust packaging platform to achieve a more space-efficient package design enabling the very dense interconnection and routing of multiple-dies, a smaller footprint and lower package profiles and a very reliable package solution. Due to the benefits of shorter interconnection length, lower conductor loss with smooth Cu surface as well as lower dielectric constant and dielectric loss of polymer layers at high frequency, eWLB is a suitable packaging solution for high speed and high frequency applications, especially in the applications of 5G/mmWave, automotive radar, fiber optical communication (FOC) and others. Among these applications, the FOC device has been viewed as the core technology to be developed to meet high-density, high-speed optical interconnects demands for devices used in communication networks, high performance computing (HPC) and data centers. This paper addresses the hermetic eWLB package characterization, assembly process and reliability study in two different FOC devices, the 25 Gb/s high speed single channel optical receiver and DML (directly modulated laser) transmitter as well as the 100 Gb/s high speed quad-channel DML transmitter. The characterization data includes optimization of equipment handling, wafer singulation, reconstitution process, warpage characterization of molded wafer and device electrical validation are reported. In addition, the package level long-term reliability tests are evaluated to examine the reliable quality and yield of these eWLB packages. The result shows that the eWLB technology is a robust and cost-effective package solution for high bandwidth and weather-proof FOC applications.
机译:由于扇出晶圆级封装(FOWLP)技术已成为下一级薄,高速,高频和精细路由俯仰封装能力的流行解决方案,嵌入式晶片级球网格阵列(EWLB)旨在解决互连间隙中不断的不匹配,集成水平较高,电气性能提高,垂直互连更短。 EWLB技术是一个多功能的FOWLP平台,提供了一种坚固的包装平台,实现更节省空间的封装设计,实现了多芯的非常密集的互连和路由,较小的占地面积和更低的封装曲线以及非常可靠的包装解决方案。由于较短的互连长度的益处,具有光滑Cu表面的较低导体损耗以及高频的聚合物层的介电常数和介电损耗,EWLB是高速和高频应用的合适包装解决方案,尤其是在应用中5G / MMWAVE,汽车雷达,光纤通信(FOC)等。在这些应用中,FOC装置已被视为待开发的核心技术,以满足通信网络中使用的设备,高性能计算(HPC)和数据中心的设备的高密度,高速光互连要求。本文解决了两个不同FOC设备中的密封EWLB包装,组装过程和可靠性研究,25 GB / S高速单通道光接收器和DML(直接调制激光)发射机以及100 GB / S高速四边形-Channel DML发射机。特征数据包括设备处理的优化,晶片分割,重构过程,模制晶片的翘曲表征和器件电验证。此外,评估包装级长期可靠性测试,以检查这些EWLB包的可靠质量和产量。结果表明,EWLB技术是一种坚固且经济高效的包装解决方案,适用于高带宽和防风雨FOC应用。

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