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Understanding the conduction mechanism of the chalcogenide Ag2S silver-doped through ab initio simulation

机译:通过从头算模拟了解硫族元素Ag2S掺杂银的导电机理

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Using first-principles calculations we have investigated the electronic properties of Ag2S, which is commonly employed as the active matrix in nonvolatile conductive-bridge random access memories (CBRAM). To better understand the origin of the high conductivity of Ag-doped Ag2S we have created a new model for the high temperature form of this material, with electronic properties in good agreement with the available data. We have found that for a local silver concentration of 7.02 × 10−4 mol/cm2Ag2S switches from a semiconductor to a metal, while for a slightly higher concentration of 7.05 × 10−4mol/cm3Ag2S forms polytetrahedral clusters within the structure. Our findings offer a consistent explanation for the measured high conductivity of Ag2S.
机译:使用第一性原理计算,我们研究了Ag2S的电子特性,Ag2S通常用作非易失性导电桥随机存取存储器(CBRAM)中的有源矩阵。为了更好地了解掺Ag的Ag2S高电导率的起源,我们为这种材料的高温形式创建了一个新模型,其电子性能与现有数据高度吻合。我们发现,当局部银浓度为7.02×10 −4 mol / cm 2 Ag2S从半导体转换为金属时,银的浓度略高时为7.05 ×10 −4 mol / cm 3 Ag2S在结构内形成多四面体簇。我们的发现为测得的Ag2S高电导率提供了一致的解释。

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