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Effect of c-Si doping density on heterojunction with intrinsic thin layer (HIT) radial junction solar cells

机译:c-Si掺杂密度对具有本征薄层(HIT)径向结太阳能电池的异质结的影响

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Radial junction Si pillar array solar cells based on the heterojunction with intrinsic thin layer (HIT) structure were fabricated from p-type crystal Si (c-Si) wafers of different doping densities. The HIT structure consisting of intrinsic-type hydrogenated amorphous Si (a-Si:H) deposited by plasma-enhanced chemical vapor deposition (PECVD) at low temperature (200 °C) was found to effectively passivate the high surface area of the p-type Si pillar arrays resulting in open circuit voltages (Voc>0.5) comparable to that obtained on planar devices. At high c-Si doping densities (>1018 cm−3), the short-circuit current density (Jsc) and energy conversion efficiency of the radial junction devices were higher than those of the planar devices demonstrating improved carrier collection in the radial junction structure.
机译:由具有不同掺杂密度的p型晶体Si(c-Si)晶片制造了基于具有本征薄层(HIT)结构的异质结的径向结Si柱阵列太阳能电池。发现由低温等离子体增强化学气相沉积(PECVD)沉积的本征/ n型氢化非晶硅(a-Si:H)构成的HIT结构可有效地在低温(200 ° C)下进行钝化p型Si柱阵列的高表面积,产生的开路电压(Voc> 0.5)可与平面器件相比。在高c-Si掺杂密度(> 10 18 cm -3 )下,径向结器件的短路电流密度(Jsc)和能量转换效率更高与平面器件相比,它们在径向接合结构中具有更好的载流子收集性能。

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