Separating SCR and trigger circuit related overshoot in SCR-based ESD protection circuits

摘要

Circuit simulation is proposed as an aid for design optimization of SCR-based ESD protection circuits. The compact models used in this work are validated by measurements. During simulation, the waveforms at the internal circuit nodes are probed; these indicate that the SCR causes most of the voltage overshoot and presents the greatest opportunity for overshoot reduction.