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Investigating the impact of stuctural symmetry in coupled resonator arrays on the frequency stability of A CMOS-MEMS oscillator

机译:研究CMOS-MEMS振荡器耦合谐振器阵列耦合谐振器阵列的影响

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This paper presents experimental observations of the variations in short-term frequency stability in a low power CMOS-MEMS oscillator embedding two mechanically coupled double-ended tuning fork (DETF) resonators as a function of induced stiffness perturbations on the resonators. The Allan deviation of the 241 kHz output from the Pierce oscillator, based on a 0.35μm CMOS technology, is logged for various stiffness perturbations values applied on the two coupled resonators. The reported results show local optimum values of structural perturbations which yield to improved short-term frequency stability measures.
机译:本文介绍了低功率CMOS-MEMS振荡器中的短期频率稳定性变化的实验观察,其嵌入两个机械耦合的双端调谐叉(DETF)谐振器作为谐振器上的诱导刚度扰动的函数。基于0.35μmCMOS技术的Pierce振荡器的241kHz输出的Allan偏差被记录在两个耦合谐振器上施加的各种刚度扰动值。据报道的结果显示了结构扰动的局部最佳值,其产生了改善的短期频率稳定性措施。

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