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Local NOR and Global NAND Match-Line Architecture for High Performance CAM

机译:用于高性能凸轮的本地和全球NAND匹配线架构

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Locally NOR and globally NAND match-line architecture and sensing circuits applicable to the high performance content addressable memory (CAM) is proposed in this paper. As word-length of CAM gets longer, the capacitance of match-line gets larger and it causes performance degradation and large dynamic power consumption. Local match-lines are segments of large capacitive match-line and designed as NOR-type maximizing search speed. The results of local match-lines are gathered into NAND global match-line indicating the final evaluation result. Current limiting and clamping scheme is implemented to local match-line to reduce dynamic power by saturating voltage level after sufficiently developed. NAND global match-line reduces average power consumption by rarely switching its value. Replica match-line is implemented for asserting the evaluation of local match-line ends and enabling global match-line. With the proposed NOR local match-line and NAND global match-line sensing scheme, search time is achieved 0.61ns which is enhanced 73.7% and average power consumption is also slightly reduced compared to the conventional.
机译:本文提出了适用于高性能内容可寻址存储器(CAM)的本地和和全球NAND匹配线架构和传感电路。随着凸轮的字距变长,匹配线的电容变大,导致性能下降和大动力消耗。本地匹配线是大电容匹配线的段,设计为NOR型最大化搜索速度。本地匹配线的结果收集到NAND全局匹配线中,指示最终的评估结果。电流限制和夹紧方案用于局部匹配线,以在充分开发后通过饱和电压水平来降低动态功率。 NAND全局匹配线通过很少切换其值,减少了平均功耗。实现副本匹配行,用于断言本地匹配行的评估并启用全局匹配行。利用所提出的或本地匹配线和NAND全局匹配线感测方案,与传统相比,搜索时间为0.61NS,其增强73.7%,并且平均功耗也略有降低。

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