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Insights into the role of surface hydroxyl of the silica fillers in the bulk properties of resulting underfills

机译:探讨二氧化硅填料表面羟基的作用在所得底部填充物的堆积性质中

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The advances of flip-chip technology have driven the development of both underfilling processes and underfill materials. Current underfill material is mainly silica filled liquid epoxy encapsulant and their properties depends to a large extent on the filler factors such as loading, size and size distribution, shape, and especially surface chemistry state. To illustrate this point, in our study, monodisperse spherical SiO particles with plenty of hydroxyl groups have been synthesized via the Sto?ber process and further thermally treated to obtain -OH-free SiO particles. Then the anhydride based underfill filled with the two types of silica filler were prepared and their performances were evaluated comparatively in order to provide insights into the role of intrinsic surface hydroxyl of the silica fillers in the bulk properties of resulting underfills. We found that as compared to the -OH-free SiO filled epoxy underfills, the presence of the surface -OH groups of silica lead to negative effects on the rheological, thermomechanical as well as reliability properties of resulting underfills, such as a sharper viscosity increase with time, an obvious decrease in glass transition temperature (Tg), the interfacial thermal stresses harder to eliminate, a much higher moisture absorption. Therefore it was necessary to remove the surface -OH groups of SiO fillers through pre-heat treatment to develop high performance underfills.
机译:倒装芯片技术的进步推动了底层过程和底部填充材料的发展。目前的底部填充材料主要是二氧化硅填充液体环氧包封剂,它们的性质在很大程度上取决于填充因子,例如装载,尺寸和尺寸分布,形状,尤其是表面化学状态。为了说明这一点,在我们的研究中,已经通过STOα方法合成了具有大量羟基的单分散球形SiO颗粒,并进一步热处理以获得无SiO颗粒。然后制备填充有两种二氧化硅填料的酸酐的底部填充物,并相对评价它们的性能,以便在所得底部填充物的块状性质中提供硅胶填料的本质表面羟基的作用。我们发现,与无-OH的SiO填充的环氧树脂填充物相比,二氧化硅的表面-OH基团的存在导致对所得底部填充的流变,热机械以及可靠性性能的负面影响,例如更清晰的粘度增加随着时间的推移,玻璃化转变温度(Tg)的明显降低,界面热应力难以消除,更高的吸湿性。因此,必须通过预热处理去除SiO填料的表面-OH基团,以开发高性能底部填充物。

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