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Systematic modeling of on-chip power grids with decaps in TSV-based 3D chip integration

机译:基于TSV的3D芯片集成中带有封头的片上电网的系统建模

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Efficient modeling of power supply noises is crucial for a robust power supply design, especially with increase in the size of on-chip power grids due to emerging 3D chip integration technology. As the power grid is interconnected vertically by through-silicon vias (TSVs), operational currents required by each functional device in integrated circuits (ICs) are supplied through vertical power and ground TSVs, and horizontal power grids. Fast switching speed of the devices become complicated the accurate analysis of the worst case power supply noises. In this paper, a systematic modeling of on-chip power grids with decoupling capacitors — VNCAPs — used in TSV-based chip integration technology is presented using novel equivalent decap circuit model. The equivalent circuit model will be numerically validated and integrated into an efficient modeling for impedance profile of on-chip power grids and analysis of power supply noises in TSV-based 3D chip integration technology.
机译:电源噪声的有效建模对于稳健的电源设计至关重要,尤其是由于新兴的3D芯片集成技术而导致片上电网尺寸增加时。当电网通过硅通孔(TSV)垂直互连时,集成电路(IC)中每个功能设备所需的工作电流将通过垂直电源和接地TSV以及水平电网提供。器件的快速开关速度使最坏情况下的电源噪声的精确分析变得复杂。在本文中,使用新颖的等效decap电路模型,提出了在基于TSV的芯片集成技术中使用的具有去耦电容器VNCAP的片上电网的系统建模。将对等效电路模型进行数值验证,并将其集成到基于片上电网的阻抗分布和基于TSV的3D芯片集成技术中的电源噪声分析的有效模型中。

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