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'Field Balanced' SG-RSO structure showing tremendous potential for low voltage Trench MOSFETs

机译:'现场平衡'SG-RSO结构显示低压沟MOSFET的巨大潜力

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This paper presents a 30V range 'Field Balanced' Split-Gate RSO (Resurf Stepped Oxide) MOSFET showing extremely low Q_(gd) of 1.0 nC mm~(-2) for the first time. By introducing a low doped region on an optimised 30V Split-Gate RSO MOSFET, the Figure of Merit (FOM) improves from 8.09 mΩ nC to around 6.40 mΩ nC. From this investigation, it has been demonstrated that the 'Field Balanced' on a a Split-Gate structure can give a good R_(dsON) vs Q_(gd) trade off. The exceptionally low Q_(gd) will allow the 'Field Balanced' structure to achieve a good efficiency even in high switching frequency converter.
机译:本文首次介绍了一个30V范围的“场平衡”分型RSO(Resurf阶梯)MOSFET,首次示出了1.0 nc mm〜(-2)的极低Q_(GD)。通过在优化的30V拆分栅极RSO MOSFET上引入低掺杂区域,优点(FOM)的数字从8.09mΩnc改善到大约6.40mΩnc。从这次调查中,已经证明了一个分裂门结构上的“场平衡”可以提供良好的R_(DSON)VS Q_(GD)折衷。对于高开关变频器即使在高开关变频器中,异常低的Q_(GD)将允许“现场平衡”结构实现良好的效率。

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