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VERY LOW ENERGY PEAK SHIFTS IN EDS SPECTRA

机译:EDS光谱的能量峰值非常低

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The response function of energy-dispersive X-ray spectrometers (EDS) has been a topic of investigation for as long as the EDS has been used. Full physics-based models were developed, which allow the calculation of the detector response function depending on detector construction parameters and in relation to the measured X-ray energies [1,2]. It is known that the low energy side of the detector response function (peak shapes) depends much from the detected photon energy, because it is important how deep the X-rays interact within the detector material to create an electron-hole pair cloud. If the interaction is near the detector surface, electron escape is likely and then the total measured energy of the photon has a loss, due to different effects of the incomplete charge collection (ICC) [2]. With photon energies < 500 eV, the typical low energy tailing in peak shapes morphs into 'all photons ICC", Finally visually as a complete peak shift having a lower measured energy than the original X-ray energy (combined with higher peak width than expected by theory). Usually the photon interaction depth decreases with lower energies, so the shift is increasing. In [2], X-rays in the energy range from 100 eV to 10 keV were investigated for three spectrometer systems different in construction, including one of which was already an SDD. The more recent SDD technology [3] and X-ray entrance windows [4] allowed investigations of X-rays even < 100 eV, which came with a surprise, because suddenly the peaks with < 100 eV photon energy are not shifted. We have modified empirically an old used shift-correction, which had a further rise of shift down to 0 eV, replaced by one which drops down below 150 eV (see Fig. 1). Finally, the measured shifts of Al-L and Si-L is calculated practically with zero and the Be-K shift is less with the modified correction curve.
机译:能量分散X射线光谱仪(EDS)的响应函数是只要使用EDS就可以调查的话题。开发了全部物理的模型,这允许根据检测器施工参数计算检测器响应功能,并与测量的X射线能量相关[1,2]。众所周知,检测器响应函数(峰值形状)的低能量侧取决于检测到的光子能量,因为重要的是X射线在检测器材料内相互作用以产生电子孔对云。如果相互作用靠近检测器表面,则由于不完全电荷收集(ICC)[2]的不同效果,电子逸出可能且电光子的总测量能量具有损失。使用光子能量<500eV,峰值形状的典型低能量拖尾变成“所有光子ICC”,最终视觉上作为一个完整的峰值偏移,其具有比原始X射线能量更低的测量能量(组合比预期更高的峰宽度根据理论)。通常光子相互作用深度随着较低的能量而减小,因此偏移正在增加。在[2]中,研究了从100eV到10ke​​V的能量范围内的X射线,包括一个不同的施工,包括一个其中已经是一个SDD。最近的SDD技术[3]和X射线入口Windows [4]允许对X射线的调查甚至是<100eV,这令人惊讶,因为突然间与<100eV光子的峰值能量没有转移。我们已经修改了旧的二手换档校正,该旧的换档校正,这进一步升级到0eV,由下降到150eV以下(参见图1)。最后,测量的换档Al-L和Si-L实际上计算通过修改的校正曲线,零和BE-k移位较少。

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