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VERY LOW ENERGY PEAK SHIFTS IN EDS SPECTRA

机译:EDS SPECTRA中的极低能量峰值偏移

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The response function of energy-dispersive X-ray spectrometers (EDS) has been a topic of investigation for as long as the EDS has been used. Full physics-based models were developed, which allow the calculation of the detector response function depending on detector construction parameters and in relation to the measured X-ray energies [1,2]. It is known that the low energy side of the detector response function (peak shapes) depends much from the detected photon energy, because it is important how deep the X-rays interact within the detector material to create an electron-hole pair cloud. If the interaction is near the detector surface, electron escape is likely and then the total measured energy of the photon has a loss, due to different effects of the incomplete charge collection (ICC) [2]. With photon energies < 500 eV, the typical low energy tailing in peak shapes morphs into 'all photons ICC", Finally visually as a complete peak shift having a lower measured energy than the original X-ray energy (combined with higher peak width than expected by theory). Usually the photon interaction depth decreases with lower energies, so the shift is increasing. In [2], X-rays in the energy range from 100 eV to 10 keV were investigated for three spectrometer systems different in construction, including one of which was already an SDD. The more recent SDD technology [3] and X-ray entrance windows [4] allowed investigations of X-rays even < 100 eV, which came with a surprise, because suddenly the peaks with < 100 eV photon energy are not shifted. We have modified empirically an old used shift-correction, which had a further rise of shift down to 0 eV, replaced by one which drops down below 150 eV (see Fig. 1). Finally, the measured shifts of Al-L and Si-L is calculated practically with zero and the Be-K shift is less with the modified correction curve.
机译:只要使用了EDS,能量色散X射线光谱仪(EDS)的响应功能就一直是研究的主题。开发了基于物理的完整模型,该模型允许根据探测器的构造参数以及与所测量的X射线能量的关系来计算探测器的响应函数[1,2]。众所周知,检测器响应函数的低能量侧(峰形)很大程度上取决于检测到的光子能量,因为重要的是X射线在检测器材料中相互作用的深度有多深,以形成电子-空穴对云。如果相互作用在检测器表面附近,则由于不完全电荷收集(ICC)的不同影响,可能会发生电子逃逸,从而使光子的总测得能量损失[2]。在光子能量<500 eV的情况下,典型的低能峰形拖尾会变成“所有光子ICC”,最后在视觉上显示为一个完整的峰位移,其实测能量低于原始X射线能量(加上比预期高的峰宽)通常,随着能量的降低,光子的相互作用深度会减小,因此位移会增加;在[2]中,研究了三种结构不同的光谱仪系统在100 eV到10 keV能量范围内的X射线。最新的SDD技术[3]和X射线入射窗[4]允许对甚至<100 eV的X射线进行研究,这很令人惊讶,因为突然间,峰的<100 eV光子我们根据经验对旧的偏移校正进行了修改,该偏移校正将偏移进一步提高到0 eV,取而代之的是下降到150 eV以下的偏移校正(见图1)。 Al-L和Si-L实际上是用修正曲线,则零值和Be-K位移较小。

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