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Cost-driven 3D design optimization with metal layer reduction technique

机译:具有金属层还原技术的成本驱动的3D设计优化

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Three-dimensional integrated circuit (3D IC) is a promising solution to continue the performance scaling. However, the fabrication cost for 3D ICs can be a major concern for the adoption of this emerging technology. In this paper, we study the cost implication for both TSV-based and interposer-based 3D ICs, with the observation that many long metal interconnects in 2D designs are replaced by TSVs in 3D designs, and therefore the number of metal layers to satisfy routing requirements can be reduced, resulting in cost saving in 3D ICs. Based on our cost model, we propose a cost-driven 3D design space optimization flow that balances the design area and metal layer requirement, by optimizing the cost tradeoffs between silicon area and the number of metal layers. With the cost-driven design optimization flow, we can achieve cost saving up to 19% for TSV-based 3D designs, and 26% for interposer-based 3D designs, respectively, compared to the baseline designs. 1
机译:三维集成电路(3D IC)是一个有前途的解决方案,可以继续性能缩放。 然而,3D IC的制造成本可能是采用这种新兴技术的主要问题。 在本文中,我们研究了基于TSV和中间插入器的3D IC的成本含义,观察到了2D设计中的许多长金属互连由3D设计中的TSV替换,因此是满足路由的金属层的数量 要求可以减少,导致3D IC中的成本节省。 根据我们的成本模式,我们提出了一种成本驱动的3D设计空间优化流程,通过优化硅面积和金属层数量之间的成本权衡来平衡设计区域和金属层要求。 通过成本驱动的设计优化流程,与基于TSV的3D设计,我们可以获得高达19%的成本高达19%,并且与基于基线设计相比,基于插入器的3D设计的26%。 1

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