Enabling ECC and Repair Features in an eFuse Box for Memory Repair Applications

摘要

To manage yield on the ever-growing memories in SoCs it is critical not to compromise on the reliability of the eFuse box storing the memory repair data. To this end, the latest eFuse memories support Error Correction Code (ECC) and repair features to increase reliability and enhance yield. However, conventional Design-For-Test (DFT) methods do not provide solutions to leverage those features. This paper proposes a methodology to enable eFuse repair and presents a custom ECC logic module that allows an eFuse box to seamlessly interface with a near-industry-standard Built-In Self-Repair (BISR) controller.