Leakage current measurement with the bench test in watchdog timer power down mode for microcontroller device

摘要

This paper discusses the bench test for failure analysis. For identify the location of a defect on die circuit in microcontroller device. Bench (ipd_wdt) test method is very helpful. When curve tracer cannot detect the electrical leakage current in the form of I-V curve characteristic. In this article we discuss the bench test in watchdog timer power down (Ipd_wdt) mode with the closing all of frequency function and programming control watchdog timer function by C language. The program will be reference by datasheet then set to measure electrical current leakage. Then put into the OBIRCH or Ion Emission process for find defect location on die circuit. To identify the possibility that the type of defect.